Textbook in PDF format
This book describes the basic technologies and operation principles of charge-trapping non-volatile memories. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved as well as the fundamental properties of the technology. Modern material properties used as charge-trapping layers, for new applications are introduced.
Materials and Device Reliability in SONOS Memories
Charge-Trap-Non-volatile Memory and Focus on Flexible Flash Memory Devices
Hybrid Memories Based on Redox Molecules
Organic Floating Gate Memory Structures
Nanoparticles-Based Flash-Like Nonvolatile Memories: Cluster Beam Synthesis of Metallic Nanoparticles and Challenges for the Overlying Control Oxide Layer